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https://doi.org/10.18429/JACoW-IPAC2014-TUPRI042
Title Numerical Study of the Microbunching Instability at UVSOR-III: Influence of the Resistive and Inductive Impedances
Authors
  • E. Roussel, S. Bielawski, C. Evain, C. Szwaj
    PhLAM/CERCLA, Villeneuve d'Ascq Cedex, France
  • M. Adachi, M. Katoh, S.I. Kimura, T. Konomi
    UVSOR, Okazaki, Japan
  • M. Hosaka, Y. Takashima, N. Yamamoto
    Nagoya University, Nagoya, Japan
  • K.S. Ilin, J. Raasch, A. Scheuring, M. Siegel, P. Thoma
    KIT, Karlsruhe, Germany
  • H. Zen
    Kyoto University, Kyoto, Japan
Abstract At high charge, relativistic electron bunches circulating in storage rings undergo an instability, the so-called microbunching or the CSR (Coherent Synchrotron Radiation) instability. This instability is due to the interaction of the electrons with their own radiation and leads to the formation of microstructures (at millimeter scale) in the longitudinal phase space. Thanks to a new type of detector, based on superconducting thin film YBCO, it is now possible to observe directly these microstructures and follow their temporal evolution*. These experimental observations open a new way to make severe comparisons with theory. Here we present results of the modeling of the dynamics at UVSOR-III using a one dimensional Vlasov-Fokker-Planck equation. We show that to obtain a relatively good agreement between numerical simulations and experiments, we have to take into account several types of impedance such as the shielded CSR impedance but also the resistive and inductive impedances.
Footnotes & References * First Direct, Real Time, Recording of the CSR Pulses Emitted During the Microbunching Instability, using Thin Film YBCO Detectors at UVSOR-III, IPAC2014
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Conference IPAC2014, Dresden, Germany
Series International Particle Accelerator Conference (5th)
Proceedings Link to full IPAC2014 Proccedings
Session Poster Session, Ribery Area
Date 17-Jun-14   16:00–18:00
Main Classification 05 Beam Dynamics and Electromagnetic Fields
Sub Classification D05 Instabilities - Processes, Impedances, Countermeasures
Keywords electron, impedance, wakefield, synchrotron, simulation
Publisher JACoW Publishing, Geneva, Switzerland
Editors Christine Petit-Jean-Genaz (CERN, Geneva, Switzerland); Gianluigi Arduini (CERN, Geneva, Switzerland); Peter Michel (HZDR, Dresden, Germany); Volker RW Schaa (GSI, Darmstadt, Germany)
ISBN 978-3-95450-132-8
Published July 2014
Copyright
Copyright © 2014 by JACoW, Geneva, Switzerland     CC-BY Creative Commons License
cc Creative Commons Attribution 3.0