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https://doi.org/10.18429/JACoW-IPAC2014-THPME159
Title Double Diffraction Radiation Target Interferometry for Micro-train Beam Diagnostics
Authors
  • D.A. Shkitov, A. Potylitsynpresenter
    TPU, Tomsk, Russia
  • A.S. Aryshev, J. Urakawa
    KEK, Ibaraki, Japan
Abstract Recently our group starts to investigate a feasibility of double diffraction radiation (DR) target interferometry for non-invasive micro-train beam diagnostics at KEK: LUCX facility. Double DR target consists of two metal plates and one of them can be moved relative to another along the beam trajectory. Micro-train beam is a sequence of short electron bunches with sub-ps spacing. As it was shown* double DR target can be used for such a beam diagnostics measuring DR yield versus plates displacement. The obtained tuning curve (interferogram) allows to determine a number of bunches within the micro-train and spacing between them. In order to design a reliable device for this aim we have to take into account different double DR target interferometer plate’s adjustment inaccuracies. These inaccuracies can be as follows: inaccuracies in the mutual adjustment of plates tilt angles to the beam trajectory, outer plate edge shift along the beam trajectory and other. The influence of the bunch form-factor shape is also considered. We investigated double DR target preparation accuracy requirements in order to minimize measurements uncertainties and increase interferometer resolution.
Footnotes & References * Skitov D.A. et. al., J. Phys.: Conf. Ser. 517, 012024 (2014).
Funding This work was supported by grant of Russian Ministry of Education and Science program “Nauka” number 2.1799.2011.
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Conference IPAC2014, Dresden, Germany
Series International Particle Accelerator Conference (5th)
Proceedings Link to full IPAC2014 Proccedings
Session Poster Session, Messi Area
Date 19-Jun-14   16:00–18:00
Main Classification 06 Instrumentation, Controls, Feedback & Operational Aspects
Sub Classification T03 Beam Diagnostics and Instrumentation
Keywords target, radiation, electron, diagnostics, detector
Publisher JACoW Publishing, Geneva, Switzerland
Editors Christine Petit-Jean-Genaz (CERN, Geneva, Switzerland); Gianluigi Arduini (CERN, Geneva, Switzerland); Peter Michel (HZDR, Dresden, Germany); Volker RW Schaa (GSI, Darmstadt, Germany)
ISBN 978-3-95450-132-8
Published July 2014
Copyright
Copyright © 2014 by JACoW, Geneva, Switzerland     CC-BY Creative Commons License
cc Creative Commons Attribution 3.0