| Title |
Preliminary Study of Non-invasive Beam Profile Measurements for Proton Beams |
| Authors |
- H. He, J.S. Cao, Q.Y. Dengpresenter, J.H. Junhui, Y.F. Sui, J. Yue, Y. Zhao
IHEP, People's Republic of China
- J. Chen
NSRRC, Hsinchu, Taiwan
|
| Abstract |
Two non-invasive beam profile measurement methods were developed for China high intensity proton beams projects, including CSNS and ADS. The first consists in an IPM (ionization beam profile monitor) system which detect the ionized products from a collision of the beam particle with residual gas atoms or molecules present in the vacuum pipe. The second is an electron beam scanner which using a low energy electron beam instead of a metal wire to sweep through the beam. The deflection of electron beam by the collective field of the high intensity beam is measured. The charge density in the high intensity beam can be restored under certain conditions or estimated by various mathematical techniques. Here we present the design parameters of the IPM system, the signal intensity of ionization products, optimization of the electric field, machine designs of electrode, tracking of the ionization products and so on. The principle of the electron beam scanner and the test results which is based on a commercial electron gun from Kimball Physics are also introduced in details.
|
| Funding |
This work was supported by NSFC under grant NO.11305186 and No.11205172 |
| Paper |
download THPME137.PDF [0.914 MB / 3 pages] |
| Export |
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| Conference |
IPAC2014, Dresden, Germany |
| Series |
International Particle Accelerator Conference (5th) |
| Proceedings |
Link to full IPAC2014 Proccedings |
| Session |
Poster Session, Messi Area |
| Date |
19-Jun-14 16:00–18:00 |
| Main Classification |
06 Instrumentation, Controls, Feedback & Operational Aspects |
| Sub Classification |
T03 Beam Diagnostics and Instrumentation |
| Keywords |
electron, proton, gun, detector, ion |
| Publisher |
JACoW Publishing, Geneva, Switzerland |
| Editors |
Christine Petit-Jean-Genaz (CERN, Geneva, Switzerland); Gianluigi Arduini (CERN, Geneva, Switzerland); Peter Michel (HZDR, Dresden, Germany); Volker RW Schaa (GSI, Darmstadt, Germany) |
| ISBN |
978-3-95450-132-8 |
| Published |
July 2014 |
| Copyright |
|
