| Title |
Measurement of Low-charged Electron Beam with a scintillator Screen |
| Authors |
- T. Vinatier, P. Bambade, C. Bruni, S. Liu
LAL, Orsay, France
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| Abstract |
Measuring electron beam charge lower than 1pC is very challenging since the traditional diagnostics, like Faraday Cup and ICT, are limited in resolution to a few pC. A way to simply measure lower charge would be to use the linear relation, existing before saturation regime, between the incident charge and the total light intensity emitted by a YAG screen. Measurement has been performed on PHIL accelerator at LAL, with charge lower than 50pC, with a YAG screen located just in front of a Faraday Cup. It shows a very good linear response of the YAG screen up to the Faraday Cup resolution limit (2pC) and therefore allows calibrating the YAG screen for lower charge measurement with an estimated precision of 4%. A noise analysis allows estimating the YAG screen resolution limit around 40fC. Results of low charge measurement on PHIL will be shown and compared to those coming from a diamond detector installed on PHIL, in order to validate the measurement principle and to determine its precision and resolution limit. Such simple measurement may thereafter be used as single-shot charge diagnostic for electron beam generated and accelerated by laser-plasma interaction.
|
| Paper |
download THPME094.PDF [0.672 MB / 3 pages] |
| Export |
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| Conference |
IPAC2014, Dresden, Germany |
| Series |
International Particle Accelerator Conference (5th) |
| Proceedings |
Link to full IPAC2014 Proccedings |
| Session |
Poster Session, Messi Area |
| Date |
19-Jun-14 16:00–18:00 |
| Main Classification |
06 Instrumentation, Controls, Feedback & Operational Aspects |
| Sub Classification |
T03 Beam Diagnostics and Instrumentation |
| Keywords |
detector, electron, diagnostics, laser, vacuum |
| Publisher |
JACoW Publishing, Geneva, Switzerland |
| Editors |
Christine Petit-Jean-Genaz (CERN, Geneva, Switzerland); Gianluigi Arduini (CERN, Geneva, Switzerland); Peter Michel (HZDR, Dresden, Germany); Volker RW Schaa (GSI, Darmstadt, Germany) |
| ISBN |
978-3-95450-132-8 |
| Published |
July 2014 |
| Copyright |
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