| Title |
A High Resolution Spatial-temporal Imaging Diagnostic for High Energy Density Physics Experiments |
| Authors |
- W. Gai
ANL, Argonne, Illinois, USA
- S. Cao, H.S. Xu, W.-L. Zhan, Z.M. Zhang, Y.T. Zhao
IMP, Lanzhou, People's Republic of China
- J.Q. Qiu
Euclid TechLabs, LLC, Solon, Ohio, USA
- C.-X. Tang
TUB, Beijing, People's Republic of China
|
| Abstract |
We present a scheme that uses a high energy electron beam as a probe for time resolved (~ pico – nano seconds) imaging measurements of high energy density processes in materials with spatial resolution of < 1 µm. The device uses an electron bunch train with a flexible time structure penetrating a time varying high density target. By imaging the scattered electron beam, the detailed target profile and its density evolution can be accurately determined. In this paper, we discuss the viability of the concept and show that for densities in the range up to 400 gram/cm³, an electron beam consisting of a train of ~800 MeV bunchlets, each a few ps long and with charges ~nC is suitable. Successful demonstration of this concept will have a major impact for both future fusion science and HEDP physics research.
|
| Paper |
download THOAB03.PDF [0.495 MB / 3 pages] |
| Slides |
download THOAB03_TALK.PDF [2.497 MB] |
| Export |
download ※ BibTeX
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※ EndNote |
| Conference |
IPAC2014, Dresden, Germany |
| Series |
International Particle Accelerator Conference (5th) |
| Proceedings |
Link to full IPAC2014 Proccedings |
| Session |
Contributed Oral Presentations, Applications of Accelerators |
| Date |
19-Jun-14 09:30–10:30 |
| Main Classification |
08 Applications of Accelerators |
| Sub Classification |
U02 Materials Analysis and Modification |
| Keywords |
electron, target, scattering, proton, diagnostics |
| Publisher |
JACoW Publishing, Geneva, Switzerland |
| Editors |
Christine Petit-Jean-Genaz (CERN, Geneva, Switzerland); Gianluigi Arduini (CERN, Geneva, Switzerland); Peter Michel (HZDR, Dresden, Germany); Volker RW Schaa (GSI, Darmstadt, Germany) |
| ISBN |
978-3-95450-132-8 |
| Published |
July 2014 |
| Copyright |
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