| Title |
Complete Simulation of Laser Induced Field Emission from Nanostructures Using a DGTD, PIC and FEM Code |
| Authors |
- A. Fallahi, F.X. Kärtner
CFEL, Hamburg, Germany
- K.K. Berggren, R. Hobbs, F.X. Kärtner, P.D. Keathley, M.E. Swanwick, L.F. Velasquez-Garcia, Y. Yang
MIT, Cambridge, Massachusetts, USA
|
| Abstract |
We present a general and efficient numerical algorithm for studying laser induced field emission from nanostructures. The method combines the Discontinuous Galerkin Time Domain (DGTD) method for solving the optical field profile, the Particle-In-Cell (PIC) method for capturing the electron dynamics and the Finite Element Method (FEM) for solving the static field distribution. The charge distribution is introduced to the time-domain method based on a modified Fowler-Nordheim field emission model, which accounts for the band-bending of the charge carriers at the emitter surface. This algorithm is capable of considering various effects in the emission process such as space-charge, Coulomb blockade and image charge. Simulation results are compared with experimental findings for optically driven electron emission from nanosharp Si-tips.
|
| Funding |
DARPA contract number N66001-11-1-4192 and the Center for Free-Electron Laser Science, DESY Hamburg. |
| Paper |
download MOPRI026.PDF [0.575 MB / 4 pages] |
| Export |
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| Conference |
IPAC2014, Dresden, Germany |
| Series |
International Particle Accelerator Conference (5th) |
| Proceedings |
Link to full IPAC2014 Proccedings |
| Session |
Poster Session, Ribery Area |
| Date |
16-Jun-14 16:00–18:00 |
| Main Classification |
03 Particle Sources and Alternative Acceleration Techniques |
| Sub Classification |
T02 Electron Sources |
| Keywords |
electron, laser, simulation, cathode, space-charge |
| Publisher |
JACoW Publishing, Geneva, Switzerland |
| Editors |
Christine Petit-Jean-Genaz (CERN, Geneva, Switzerland); Gianluigi Arduini (CERN, Geneva, Switzerland); Peter Michel (HZDR, Dresden, Germany); Volker RW Schaa (GSI, Darmstadt, Germany) |
| ISBN |
978-3-95450-132-8 |
| Published |
July 2014 |
| Copyright |
|
