Kube, G. Artyukov, I.A. Bajt, S. Lauth, W. Potylitsyn, A. Sukhikh, L.G. Vukolov, A.V. JACoW Geneva, Switzerland 978-3-95450-176-2 10.18429/JACoW-IBIC2015-TUPB012 English 330-334 TUPB012 electron experiment simulation radiation optics Contribution to a conference proceedings 2016 2016-01 http://dx.doi.org/10.18429/JACoW-IBIC2015-TUPB012 http://accelconf.web.cern.ch/AccelConf/IBIC2015/papers/tupb012.pdf Standard beam profile measurements of high-brightness electron beams based on optical transition radiation (OTR) may be hampered by coherence effects induced by the micro-bunching instability which render a direct beam imaging impossible. As consequence, for modern linac based 4th generation light sources as the European XFEL which is currently under construction in Hamburg, transverse beam profile measurements are based on scintillating screen monitors. However, the resolution of a scintillator based monitor is limited due to intrinsic material properties and the observation geometry [*,**]. In this report we present the results of beam size measurements in the order of a few microns using a LYSO:Ce scintillator and discuss the possible achievable resolution.