<xml>
  <records>
    <record>
       <contributors>
          <authors>
             <author>Loos, H.</author>
          </authors>
       </contributors>
       <titles>
          <title>
             COTR Resistant Profile Monitor
          </title>
       </titles>
       <pages>TUD01</pages>
       <keywords>
          <keyword>electron</keyword>
          <keyword>laser</keyword>
          <keyword>diagnostics</keyword>
          <keyword>radiation</keyword>
          <keyword>bunching</keyword>
       </keywords>
       <dates>
          <year>2015</year>
          <pub-dates>
             <date>2015-12</date>
          </pub-dates>
       </dates>
       <abstract>
          Electron beam accelerators used as drivers for short wavelength FELs need ultra-high brightness beams with small emittances and highly compressed bunch lengths. The acceleration and beam transport process of such beams leads to micro-bunching instabilities which cause the emergence of coherent optical transition radiation (COTR). The effect of COTR on profile monitors based on OTR or fluorescent screens can be quite detrimental to their intended use to measure beam sizes and profiles. This presentation will review past observations of the beam diagnostics issues due to COTR and discuss various mitigation schemes for profile monitors as well as present experience with such implementations.
       </abstract>
    </record>
  </records>
</xml>
