MOOAI01
RIKEN/SPring-8, Hyogo, Japan
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MOOAI01 |
Future Perspective on X-ray Laser and Electron Microscopy based on High Performance Particle Beams | |
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| Leaning from X-ray laser technology development, now we know of the high performance electron beams; its generation and handling. Using X-ray FEL beams, now we start developing new technologies matching with such a high coherent intensity X-ray shot. Among them, imaging of atomic level structure is common target with electron microscopy. Learning between two communities will be very important and I personally believe it become more creative for us. I will present personal perspective on interdisciplinary science along with this direction. | ||
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Slides MOOAI01 [9.028 MB] | |