| Title |
High-Precision Measurements of the Quality Factor of Superconducting Cavities at the FREIA Laboratory |
| Authors |
- V.A. Goryashko, K.J. Gajewski, L. Hermansson, H. Li, H. Nicander, R.J.M.Y. Ruber, R. Santiago Kern, S. Teerikoski
Uppsala University, Uppsala, Sweden
- D.S. Dancila
Uppsala University, Department of Engineering Sciences, Uppsala, Sweden
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| Abstract |
In this paper we propose a high-precision method of measuring Q0 of SRF cavities. A common way to study the performance of an SRF cavity is to build an oscillator around it that is referred to as a self-exciting loop. In the standard approach, by tuning the loop phase for a maximum field level in the cavity and measuring forward and reflected waves, one finds the cavity coupling. Then, performing a time-decay measurement and finding the total quality factor, one gets Q0. However, this approach suffers from a deficiency originating from a single data-point measurement of the reflection coefficient. In our method by varying the loop phase shift, one obtains amplitudes of the reflection coefficient of the cavity as a function of its phases. The complex reflection coefficient describes a perfect circle in polar coordinates. Fitting the overdetermined set of data to that circle allows more accurate calculation of Q0 via the least-squares procedure. The method has been tested at the FREIA Laboratory on two cavities from IPN Orsay: a single spoke and a prototype ESS double spoke.
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| Paper |
download TUPB089.PDF [0.470 MB / 4 pages] |
| Conference |
SRF2015, Whistler, BC, Canada |
| Series |
International Conference on RF Superconductivity (17th) |
| Proceedings |
Link to full SRF2015 Proccedings |
| Session |
Poster Session |
| Date |
15-Sep-15 14:30–17:40 |
| Main Classification |
SRF Technology - Cavity |
| Keywords |
cavity, coupling, impedance, network, SRF |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Robert E. Laxdal (TRIUMF, Vancouver, BC, Canada); Jana Thomson (TRIUMF, Vancouver, BC, Canada); Volker RW Schaa (GSI, Darmstadt, Germany) |
| ISBN |
978-3-95450-178-6 |
| Published |
December 2015 |
| Copyright |
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