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DOI:10.18429/JACoW-SRF2015-MOPB036
Title TOF-SIMS Study of Nitrogen Doping Niobium Samples
Authors
  • Z.Q. Yang, L. Lin, X.Y. Lu, W.W. Tan, D.Y. Yang, J. Zhao
    PKU, Beijing, People's Republic of China
Abstract Nitrogen doping treatment with the subsequent electropolishing (EP) of the niobium superconducting cavity can significantly increase the cavity’s quality factor up to a factor of 3. The nitrogen doping experiment has been successfully repeated and demonstrated. But the mechanism of the nitrogen doping effect remains unclear. Nitrogen doping study on niobium samples was carried out in Peking University. The niobium samples were manual processed to avoid heat generation. The experiment condition is close to that of the Fermilab. After the nitrogen doping treatment, the samples were mildly electropolished with the thickness of 1.3μm, 1.9μm, 3.3μm, 4.2μm, 5.1μm, 5.9μm and 7.0μm. The time of flight secondary ion mass spectrometry (TOF-SIMS) measurements show that the samples directly after nitrogen doping have a much higher nitrogen concentration in the depth of about 90nm. When the EP removal is larger than 1.3μm, the samples’ impurity elements is remarkably reduced and their distribution is similar to each other. Also the measured results to some extent prove that EP removal can introduce H to the niobium surface.
Paper download MOPB036.PDF [0.987 MB / 5 pages]
Conference SRF2015, Whistler, BC, Canada
Series International Conference on RF Superconductivity (17th)
Proceedings Link to full SRF2015 Proccedings
Session Poster Session
Date 14-Sep-15   14:20–17:30
Main Classification Fundamental SRF R&D - Bulk Nb
Keywords niobium, experiment, cavity, vacuum, ion
Publisher JACoW, Geneva, Switzerland
Editors Robert E. Laxdal (TRIUMF, Vancouver, BC, Canada); Jana Thomson (TRIUMF, Vancouver, BC, Canada); Volker RW Schaa (GSI, Darmstadt, Germany)
ISBN 978-3-95450-178-6
Published December 2015
Copyright
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