| Title |
Simulation of the Distribution of Parasitic Ions in the Potential of an Electron Beam |
| Authors |
- E. Brentegani, U. van Rienen
Rostock University, Faculty of Computer Science and Electrical Engineering, Rostock, Germany
- W. Hillert, D. Sauerland
ELSA, Bonn, Germany
- A. Meseck
HZB, Berlin, Germany
|
| Abstract |
In an electron machine, positively charged ions are generated by direct collision between the beam and the residual gas molecules or by synchrotron radiation. If no countermeasure is employed, they can be trapped in the beam potential and accumulate over time until the full beam neutralization is reached. Ion clouds can cause incoherent tune shifts and coherent beam instabilities, therefore they are a performance limiting factor for high current electron storage rings as well as Energy Recovery Linacs (ERLs). In order to give a detailed estimation of their effects on the beam dynamics and to further optimize the existing ion clearing techniques, accurate knowledge on the ion density distribution is required. In the following we present numerical studies on the distribution of ionized gas while interacting with electron bunch trains. The simulations have been performed with the software MOEVE PIC Tracking developed at the University of Rostock*.
|
| Footnotes & References |
* A. Markovik, Simulation of the interaction of positively charged beams and electron clouds, PhD thesis, 2013 |
| Funding |
Work foundend by BMBF, Germany under contract 05K13HRC |
| Paper |
download WEP32.PDF [0.443 MB / 3 pages] |
| Conference |
ICAP2015, Shanghai, China |
| Series |
International Computational Accelerator Physics Conference (12th) |
| Proceedings |
Link to full ICAP2015 Proccedings |
| Session |
Poster Session Wollaston |
| Date |
14-Oct-15 13:30–15:30 |
| Main Classification |
B-1 Beam Dynamics Simulation |
| Keywords |
ion, electron, simulation, vacuum, linac |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Kwok C. Ko (SLAC, Menlo Park, CA, USA); Volker R.W. Schaa (GSI, Darmstadt, Germany); Chuanxiang Tang (Tsinghua University, Beijing, China); Heping Yan (SINAP, Shanghai, China) |
| ISBN |
978-3-95450-136-6 |
| Published |
February 2016 |
| Copyright |
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