| Title |
LANSCE 1L Harp Data Acquisition System Upgrade: First Results |
| Authors |
- J.D. Sedillo, D. Martinez, J.D. Nguyen
LANL, Los Alamos, New Mexico, USA
|
| Abstract |
Efforts applied toward the upgrade of the LANSCE 1L harp beam diagnostic data acquisition system have completed with the system's successful deployment in late December 2014. Leveraging the principle of secondary electron emission, the data acquisition system measures the particle beam-induced, negative charge-loss response of a statically-located, harp-style, beam diagnostic sensor. The harp's sense wires span two orthogonal planes, transversely oriented with the beam's direction of travel resulting in two orthogonal profiles. The profile data provided by this beam diagnostic system allows LANSCE operators to measure the particle beam's transverse properties prior to reaching its final destination: the 1L target. Details will be provided with respect to the system's final hardware architecture, the system's theoretical beam response model, and the system's measured beam response.
|
| Funding |
U.S. Department of Energy under contract no. DE-AC52-06NA25396 |
| Paper |
download TUPB081.PDF [1.000 MB / 5 pages] |
| Conference |
IBIC2015, Melbourne, Australia |
| Series |
International Beam Instrumentation Conference (4th) |
| Proceedings |
Link to full IBIC2015 Proccedings |
| Session |
Poster Session 2 |
| Date |
15-Sep-15 16:00–18:00 |
| Main Classification |
Transverse Profile Monitors |
| Keywords |
electron, data-acquisition, diagnostics, FPGA, beam-diagnostic |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Mark Boland (SLSA, Clayton, Australia); David Button (ANSTO, Menai, Australia); Kathleen Riches (SLSA, Clayton, Australia); Volker RW Schaa (GSI, Darmstadt, Germany) |
| ISBN |
978-3-95450-176-2 |
| Published |
January 2016 |
| Copyright |
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