| Title |
Design of Coded Aperture Optical Elements for SuperKEKB X-ray Beam Size Monitors |
| Authors |
- E. Mulyani
Sokendai, Ibaraki, Japan
- J.W. Flanagan
KEK, Ibaraki, Japan
|
| Abstract |
We describe the design of coded aperture optical elements for the SuperKEKB x-ray beam size monitors. X-ray beam profile monitor are being installed in each ring of SuperKEKB (LER and HER) to provide high resolution bunch-by-bunch, turn-by-turn measurement capability for low emittance tuning, collision tuning and instability measurements. We use two types of optical elements, single-slit (pinhole) and multi-slit optical elements (coded apertures, CA). CA imaging offers greater open aperture than a single pinhole, for greater photon throughput and better statistical resolution for single-shot measurements. X-rays produced by a hard-bend magnet pass through a pinhole or CA optical element onto a detector. The resolution is obtained by calculating the differences between the images recorded by the detector for various simulated beam sizes, for a given number of photons. The CA elements that we have designed for use at SuperKEKB are estimated to provide 1.25-2.25 microns resolution for 10-25 microns of vertical beam sizes at 1 mA bunches. We present the design principle and optimizing process used to optimize the resolution at various beam sizes for SuperKEKB.
|
| Paper |
download TUPB025.PDF [0.979 MB / 4 pages] |
| Poster |
download TUPB025_POSTER.PDF [6.149 MB] |
| Conference |
IBIC2015, Melbourne, Australia |
| Series |
International Beam Instrumentation Conference (4th) |
| Proceedings |
Link to full IBIC2015 Proccedings |
| Session |
Poster Session 2 |
| Date |
15-Sep-15 16:00–18:00 |
| Main Classification |
Transverse Profile Monitors |
| Keywords |
detector, photon, optics, electron, emittance |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Mark Boland (SLSA, Clayton, Australia); David Button (ANSTO, Menai, Australia); Kathleen Riches (SLSA, Clayton, Australia); Volker RW Schaa (GSI, Darmstadt, Germany) |
| ISBN |
978-3-95450-176-2 |
| Published |
January 2016 |
| Copyright |
|
