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| Title | Transverse Beam Profile Imaging of Few-Micrometer Beam Sizes Based on a Scintillator Screen | |||||
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| Abstract | Standard beam profile measurements of high-brightness electron beams based on optical transition radiation (OTR) may be hampered by coherence effects induced by the micro-bunching instability which render a direct beam imaging impossible. As consequence, for modern linac based 4th generation light sources as the European XFEL which is currently under construction in Hamburg, transverse beam profile measurements are based on scintillating screen monitors. However, the resolution of a scintillator based monitor is limited due to intrinsic material properties and the observation geometry [*,**]. In this report we present the results of beam size measurements in the order of a few microns using a LYSO:Ce scintillator and discuss the possible achievable resolution. | |||||
| Footnotes & References | [*] G. Kube et al., Proc. IPAC'12 (2012) WEOAA02. [**] B. Walasek-Höhne and G. Kube, Proc. DIPAC'11 (2011) WEOB01. |
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| Funding | This work was partly supported by the by the Russian Ministry of Education and Science within the program 'Nauka' Grant No. 3.709.2014/K. | |||||
| Paper | download TUPB012.PDF [0.334 MB / 5 pages] | |||||
| Conference | IBIC2015, Melbourne, Australia | |||||
| Series | International Beam Instrumentation Conference (4th) | |||||
| Proceedings | Link to full IBIC2015 Proccedings | |||||
| Session | Poster Session 2 | |||||
| Date | 15-Sep-15 16:00–18:00 | |||||
| Main Classification | Transverse Profile Monitors | |||||
| Keywords | electron, experiment, simulation, radiation, optics | |||||
| Publisher | JACoW, Geneva, Switzerland | |||||
| Editors | Mark Boland (SLSA, Clayton, Australia); David Button (ANSTO, Menai, Australia); Kathleen Riches (SLSA, Clayton, Australia); Volker RW Schaa (GSI, Darmstadt, Germany) | |||||
| ISBN | 978-3-95450-176-2 | |||||
| Published | January 2016 | |||||
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