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| Title | Micron-Scale Vertical Beam Size Measurements Based on Transition Radiation Imaging With a Schwarzschild Objective | |||||
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| Abstract | Transverse beam profile diagnostics in the case of micron-scale beam sizes from modern electron accelerators are a challenging task. Backward transition radiation (BTR) imaging in the visible spectral region which is usually applied is close to the diffraction limit, i.e. the measured beam image is dominated by the point-spread function (PSF) [*, **]. In order to improve the resolution and to measure sub-micron beam sizes, the influence of the PSF should be decreased which depends not only on the wavelength, but also on optical aberrations. This can be realized by imaging in the EUV spectral region using a multilayer Schwarzschild objective which is free of some types of aberrations [***]. A first test experiment devoted to micron-scale beam size measurements has been carried out at the Mainz Microtron MAMI (Germany), using visible BTR and a Schwarzschild objective. This report summarizes first results of PSF dominated imaging with vertical beam sizes in the order of a few microns. Possibilities to extend the use of a Schwarzschild objective in future experiments with EUV BTR will be discussed. | |||||
| Footnotes & References | * P. Karataev et al., PRL 107 (2011) 174801. ** G. Kube et al., proc. of IPAC13 (2013) MOPME010. *** I.A. Artyukov et al, Opt. Eng. 39 (2000) 2163. |
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| Funding | The work was partially supported by the Russian Ministry of Education and Science within the program Nauka Grant No. 3.709.2014/K | |||||
| Paper | download TUPB011.PDF [1.190 MB / 3 pages] | |||||
| Conference | IBIC2015, Melbourne, Australia | |||||
| Series | International Beam Instrumentation Conference (4th) | |||||
| Proceedings | Link to full IBIC2015 Proccedings | |||||
| Session | Poster Session 2 | |||||
| Date | 15-Sep-15 16:00–18:00 | |||||
| Main Classification | Transverse Profile Monitors | |||||
| Keywords | radiation, experiment, target, diagnostics, beam-diagnostic | |||||
| Publisher | JACoW, Geneva, Switzerland | |||||
| Editors | Mark Boland (SLSA, Clayton, Australia); David Button (ANSTO, Menai, Australia); Kathleen Riches (SLSA, Clayton, Australia); Volker RW Schaa (GSI, Darmstadt, Germany) | |||||
| ISBN | 978-3-95450-176-2 | |||||
| Published | January 2016 | |||||
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