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| Title | Recent Progress in X-Ray Emittance Diagnostics at SPring-8 | |||||
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| Abstract | Synchrotron radiation in the X-ray range is suitable for non-destructive diagnostics of beam emittance *. Both direct imaging and interferometric techniques can resolve the micrometer-order transverse beam size. The beam emittance is obtained from the measured beam size with the knowledge of the betatron and dispersion functions and the beam energy spread. At the SPring-8 storage ring, we have recently developed two X-ray instruments for emittance diagnostics. The one for a bending magnet source is the X-ray pinhole camera which directly images the beam profile. A pinhole in the atmosphere is composed of combined narrow X-Y slits made of tungsten. A scintillator crystal is used to convert the X-ray beam image to a visible image. The spatial resolution is about 7 micrometers. It is operated for continuous emittance diagnostics and coupling correction of user operation of SPring-8. The other for an undulator source is the X-ray Fresnel diffractometry monitor **. Monochromatic X-rays are cut out by a single slit, and the vertical beam size is deduced from the depth of the central dip in a double-lobed diffraction pattern. Resolving beam size less than 5 micrometers is feasible. | |||||
| Footnotes & References | * S. Takano, IPAC2010 WEZMH01, p2392. (2010) ** M. Masaki et al., Phys. Rev. ST Accel. Beams 18, 042802 (2015). |
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| Paper | download TUCLA02.PDF [1.229 MB / 5 pages] | |||||
| Slides | download TUCLA02_TALK.PDF [6.314 MB] | |||||
| Conference | IBIC2015, Melbourne, Australia | |||||
| Series | International Beam Instrumentation Conference (4th) | |||||
| Proceedings | Link to full IBIC2015 Proccedings | |||||
| Session | Transverse Profile Monitors | |||||
| Date | 15-Sep-15 14:00–15:30 | |||||
| Main Classification | Transverse Profile Monitors | |||||
| Keywords | diagnostics, emittance, synchrotron, undulator, operation | |||||
| Publisher | JACoW, Geneva, Switzerland | |||||
| Editors | Mark Boland (SLSA, Clayton, Australia); David Button (ANSTO, Menai, Australia); Kathleen Riches (SLSA, Clayton, Australia); Volker RW Schaa (GSI, Darmstadt, Germany) | |||||
| ISBN | 978-3-95450-176-2 | |||||
| Published | January 2016 | |||||
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