| Title |
A Modular Application for IPM Simulations |
| Authors |
- D.M. Vilsmeier, P. Forck, M. Sapinski
GSI, Darmstadt, Germany
|
| Abstract |
Simulating the electron and ion tracking in Ionization Profile Monitors is an important tool for specifying and designing new monitors. It is also essential for understanding the effects related to the ionization process, guiding field non-uniformities and influence of the beam fields which may lead to a distortion of measured profiles. Existing simulation codes are often tuned to the specific needs of a laboratory, are not well documented and lack a practical user interface. This work presents a generic simulation tool which combines the features of existing codes in order to provide a common standard for IPM simulations. The modular structure of the application allows for exchanging the computational modules depending on the use case and makes it extensible to new use cases. By this means simulations of Beam Induced Fluorescence monitors based on supersonic gas jets have been realized. The application and all involved methods have been tested and benchmarked against existing results. The code is well documented and includes a graphical user interface. It is publicly available as a git repository and as a Python package.
|
| Paper |
download WEPCC07.PDF [1.207 MB / 4 pages] |
| Export |
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※ EndNote |
| Conference |
IBIC2017, Grand Rapids, MI, USA |
| Series |
International Beam Instrumentation Conference (6th) |
| Proceedings |
Link to full IBIC2017 Proccedings |
| Session |
Wednesday Poster |
| Date |
23-Aug-17 16:00–18:00 |
| Main Classification |
6 Beam Profile Monitors |
| Keywords |
ion, simulation, electron, proton, GUI |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Zhengzheng Liu (FRIB, East Lansing, MI, USA); Steven Lidia (FRIB, East Lansing, MI, USA); Amy McCausey (FRIB, East Lansing, MI, USA); Volker RW Schaa (GSI, Darmstadt, Germany) |
| ISBN |
978-3-95450-192-2 |
| Published |
March 2018 |
| Copyright |
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