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| Title | Understanding and Compensating Emittance Diluting Effects in Highly Optimized Ultrafast Electron Diffraction Beamlines | |||||
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| Abstract | The application of Multiobjective Genetic Algorithm optimization (MOGA) to photoemission based ultrafast electron diffraction (UED) beamlines featuring extremely low cathode mean transverse energies has lead to designs with emittances as low as 1 nm for sub-picosecond bunches with 10⁵ electrons*. Analysis of these results shows significant emittance growth during transport: with emittance dilution as high as a factor of 200-4000% for various designs and optics settings. In this study we quantify and model the individual sources of emittance growth (slice mismatches and space charge), and explore the use of the core emittance as a strong invariant. | |||||
| Footnotes & References | C. Gulliford, A. Bartnik, and I. Bazarov. Multi- objective optimizations of a novel cryocooled dc gun based UED beam line. Phys. Rev. Ac- celerators and Beams, 19(9):093402, 2016. |
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| Funding | This work was supported by the Center for Bright Beams, NSF PHY-1549132 and Department of Energy grant DE-SC0014338. | |||||
| Paper | download THPAF024.PDF [0.214 MB / 3 pages] | |||||
| Export | download ※ BibTeX ※ LaTeX ※ Text/Word ※ RIS ※ EndNote | |||||
| Conference | IPAC2018, Vancouver, BC, Canada | |||||
| Series | International Particle Accelerator Conference (9th) | |||||
| Proceedings | Link to full IPAC2018 Proccedings | |||||
| Session | MC5 Poster Session | |||||
| Date | 03-May-18 09:00–12:00 | |||||
| Main Classification | 05 Beam Dynamics and EM Fields | |||||
| Sub Classification | D09 Emittance Manipulation, Bunch Compression and Cooling | |||||
| Keywords | emittance, electron, space-charge, cathode, gun | |||||
| Publisher | JACoW Publishing, Geneva, Switzerland | |||||
| Editors | Shane Koscielniak (TRIUMF, Vancouver, BC, Canada); Todd Satogata (JLab, Newport News, VA, USA); Volker RW Schaa (GSI, Darmstadt, Germany); Jana Thomson (TRIUMF, Vancouver, BC, Canada) | |||||
| ISBN | 978-3-95450-184-7 | |||||
| Published | June 2018 | |||||
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